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Extending the Life of Low Voltage Adjustable Speed Drives

October 12 @ 12:00 pm - 1:00 pm

Lunch and Learn Opportunity IEEE Spokane is pleased to present this very current virtual event, featuring some new silicon carbide industrial semiconductor devices. =============================================================================== A fundamental aspect of LV Adjustable Speed Drives (ASD) overcurrent protection is to eliminate input power anomalies which could significantly damage the sensitive electronics within the ASD. This talk will provide an overview of the newest Low Voltage Solid-State Circuit Breaker technology (SSCB) and how industry users can take advantage of eliminating almost all electro-mechanical stress at the input to any LV ASD. While providing the lowest let through energy level of any overcurrent protective device available today, at the same time, these devices reduce the arc flash incident energy to near negligible levels and require almost no maintenance. Background In the past, Low Voltage Molded Case Circuit Breakers, (LV MCCB) or fast-acting (“semi-conductor”) fuses have been used for input overcurrent protection for low voltage ASD. Each ASD supplier will typically recommend specific overcurrent protection devices for the input protection of their units. Superior ASD protection can be achieved using the newest and very rapidly growing Low Voltage Solid-State Circuit Breaker (SSCB) technology. Using silicon carbide (SiC) semiconductor modules, the SSCB unique current sensing methodologies can outperform any MCCB or fuse protection, interrupting the highest short circuit currents faster than any either of the previous overcurrent methods. The SSCB provides extremely rapid and arc less switching operation! Since the current interruption is performed without any electro-mechanical contacts, these devices can provide almost an unlimited number of switching operations. And at the same time, release virtually no arc flash incident energy and limit the let through currents to only 1500A – even with a system short circuit current level of up to 200kA. Register for the technical event to learn more. Speaker(s): John A. Kay C.E.T, IEEE Fellow, Agenda: Virtual: https://events.vtools.ieee.org/m/324962

Details

Date:
October 12
Time:
12:00 pm - 1:00 pm
Event Category:
Website:
https://events.vtools.ieee.org/m/324962
IEEE WIE
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