Webinar Description:
Join us for an insightful webinar focused on the critical topic of de-embedding in high-frequency and high-speed digital designs. As the demand for faster and more reliable electronic devices continues to grow, understanding de-embedding techniques has become essential for engineers and designers working in the fields of RF, microwave, and digital signal integrity.
What You Will Learn:
– The fundamentals of VNA measurements
– What S-parameters are and how they are used to measure network
· The importance of calibration in network analyzer measurements
– Fundamentals of De-Embedding
– Test fixture performance criteria
– Demo of De-embedding with R&S ZNA
Who Should Attend:
This webinar is ideal for engineers, designers, and technicians involved in RF, microwave, and high-speed digital circuit design and testing. Whether you are a seasoned professional or new to the field, this session will provide valuable insights to enhance your understanding and skills.
Speaker(s): Mahwash Arjumand,
Virtual: https://events.vtools.ieee.org/m/474480
