EMC (ElectroMagnetic Compatibility) issues are more prominent in present day electronics because of miniaturization and IoT (Internet of Things). As such, EMC analysis in the early product design phase helps mitigate emission and immunity issues, as well as investigate problems due to external or co-site interference. This talk presents a comprehensive overview of Feko capabilities for EMC issues involving cables by combining field and cable simulations, with live demonstrations.
Speaker(s): Gopinath Gampala, Dr. C.J. Reddy
Virtual: https://events.vtools.ieee.org/m/473524
